Influence of trapping states at the dielectric–dielectric interface on the stability of organic field-effect transistors with bilayer gate dielectric

Published 2011 View Full Article

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Title
Influence of trapping states at the dielectric–dielectric interface on the stability of organic field-effect transistors with bilayer gate dielectric
Authors
Keywords
-
Journal
ORGANIC ELECTRONICS
Volume 12, Issue 8, Pages 1304-1313
Publisher
Elsevier BV
Online
2011-05-12
DOI
10.1016/j.orgel.2011.04.019

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