Thermal annealing effect on the crack development and the stability of 6,13-bis(triisopropylsilylethynyl)-pentacene field-effect transistors with a solution-processed polymer insulator

Published 2010 View Full Article

Authors

Keywords

Journal

ORGANIC ELECTRONICS

Volume 11, Issue 5, Pages 784-788

Publisher

Elsevier BV

Online

2010-01-26

DOI

10.1016/j.orgel.2010.01.019

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ORGANIC ELECTRONICS

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Reagent

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