Journal
THIN SOLID FILMS
Volume 584, Issue -, Pages 270-276Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2015.01.067
Keywords
Crystalline-amorphous multilayer; Size dependence; Nanoindentation; Shear band
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Funding
- National Natural Science Foundation of China [51171141, 51271141, 51471131]
- Program for New Century Excellent Talents in University [NCET-11-0431]
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Built upon recent findings that nanocrystalline-amorphous multilayers could possess both high strength and ductility due to nano-layer-limited structures, depth-sensing nanoindentation was employed to evaluate the hardness and shear band deformation behavior of nanoscale crystalline-Cu/amorphous-CuZr (C/A) multilayers among a wide range of amorphous layer thickness with constant crystalline Cu layer thickness. By varying individual layer thickness of amorphous layers, both weakening and strengthening effects on the hardness of C/A multilayers were observed, comparing with that derived from the rule of mixture, for which discontinuity of dislocation motion played a crucial role. A critical amorphous layer thickness of 20 nm was identified, above which interface-dislocation-absorption dominated plastic deformation, causing the weakening effect, below which, continuous-dislocation-impediment took over and was responsible for the strengthening effect. Mechanisms underlying the observed shear band morphologies under indentation were also extendedly discussed. (C) 2015 Elsevier B.V. All rights reserved.
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