Journal
OPTICS LETTERS
Volume 34, Issue 7, Pages 1048-1050Publisher
OPTICAL SOC AMER
DOI: 10.1364/OL.34.001048
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Funding
- Korea Science and Engineering Foundation (KOSEF)
- Korea government Ministry of Science and Technology [R01-2007-000-21055-0]
- Kwangwoon University
- National Research Foundation of Korea [핵C6A1703, 2007-0057094, R01-2007-000-21055-0] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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A refractometric sensor resorting to a vertically coupled polymeric microdisk resonator was demonstrated, estimating the refractive index (RI) of an analyte by monitoring the resonant wavelength shift in its transfer characteristics. The disk resonator was especially overlaid with a high RI TiO2 film, thereby reinforcing the interaction of the evanescent field of its guided mode with the analyte. The sensitivity of the sensor was theoretically and experimentally confirmed to be enhanced by adjusting the overlay thickness. The fabricated sensor provided the maximum sensitivity of similar to 294 nm/RIU (refractive index unit) with the 40-nm-thick overlay, which is equivalent to an improvement of 150% compared with the case without the overlay. (C) 2009 Optical Society of America
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