Localization events-based sample drift correction for localization microscopy with redundant cross-correlation algorithm

Title
Localization events-based sample drift correction for localization microscopy with redundant cross-correlation algorithm
Authors
Keywords
-
Journal
OPTICS EXPRESS
Volume 22, Issue 13, Pages 15982
Publisher
The Optical Society
Online
2014-06-20
DOI
10.1364/oe.22.015982

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