Journal
OPTICS EXPRESS
Volume 22, Issue 2, Pages 1953-1963Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.22.001952
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We report on factors affecting the performance of a broadband, mid-IR absorber based on multiple, alternating dielectric / metal layers. In particular, we investigate the effect of interface roughness. Atomic layer deposition produces both a dramatic suppression of the interface roughness and a significant increase in the optical absorption as compared to devices fabricated using a conventional thermal evaporation source. Absorption characteristics greater than 80% across a 300 K black body spectrum are achieved. We demonstrate a further increase in this absorption via the inclusion of a patterned, porous anti-reflection layer. (C) 2014 Optical Society of America
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