Brewster “mode” in highly doped semiconductor layers: an all-optical technique to monitor doping concentration

Title
Brewster “mode” in highly doped semiconductor layers: an all-optical technique to monitor doping concentration
Authors
Keywords
-
Journal
OPTICS EXPRESS
Volume 22, Issue 20, Pages 24294
Publisher
The Optical Society
Online
2014-09-26
DOI
10.1364/oe.22.024294

Ask authors/readers for more resources

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started