Journal
OPTICS EXPRESS
Volume 21, Issue 10, Pages 11994-12001Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.21.011994
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Funding
- Intel Corporation through an ASU Consortium
- Connection One
- China Scholarship Council
- Fulton Undergraduate Research Initiative (FURI) program at Arizona State University
- United States National Science Foundation funding through REU program
- NSF [CMMI-0700440, ECCS-0926017]
- Div Of Electrical, Commun & Cyber Sys
- Directorate For Engineering [926017] Funding Source: National Science Foundation
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We report a strain sensing approach that utilizes wrinkled patterns on poly (dimethylsiloxane) (PDMS) as an optical grating to measure thermally-induced strain of different materials. The mechanism for the strain sensing and the effect of PDMS grating on strain sensing are discussed. By bonding the PDMS grating onto a copper or silicon substrate, the coefficient of thermal expansion (CTE) of the substrates can be deduced by measuring the diffraction angle change due to the change in PDMS grating periodicity when thermal strain is introduced. The measured CTEs agree well with the known reference values. (C) 2013 Optical Society of America
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