Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films

Optical properties of cobalt slanted columnar thin films passivated by atomic layer deposition

(2012) Daniel Schmidt et al.   APPLIED PHYSICS LETTERS

Protein adsorption on and swelling of polyelectrolyte brushes: A simultaneous ellipsometry-quartz crystal microbalance study

(2011) Eva Bittrich et al.   Biointerphases

Combined optical and acoustical method for determination of thickness and porosity of transparent organic layers below the ultra-thin film limit

(2011) K. B. Rodenhausen et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

DETECHIP®: A Sensor for Drugs of Abuse

(2010) Raychelle M. Burks et al.   JOURNAL OF FORENSIC SCIENCES

Hybrid Generalized Ellipsometry and Quartz Crystal Microbalance Nanogravimetry for the Determination of Adsorption Isotherms on Biaxial Metal Oxide Films

(2010) R. Alan May et al.   Journal of Physical Chemistry Letters

Optical properties of hybrid titanium chevron sculptured thin films coated with a semiconducting polymer

(2010) Daniel Schmidt et al.   THIN SOLID FILMS

Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry

(2009) Daniel Schmidt et al.   APPLIED PHYSICS LETTERS

Size and Shape of Protein Molecules at the Nanometer Level Determined by Sedimentation, Gel Filtration, and Electron Microscopy

(2009) Harold P. Erickson   BIOLOGICAL PROCEDURES ONLINE

Folding-based electrochemical DNA sensor fabricated on a gold-plated screen-printed carbon electrode

(2009) Weiwei Yang et al.   CHEMICAL COMMUNICATIONS

Optical, structural, and magnetic properties of cobalt nanostructure thin films

(2009) D. Schmidt et al.   JOURNAL OF APPLIED PHYSICS

Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films

(2009) D. Schmidt et al.   OPTICS LETTERS

Fibronectin Adsorption on Tantalum: The Influence of Nanoroughness

(2008) Mads Bruun Hovgaard et al.   JOURNAL OF PHYSICAL CHEMISTRY B

Generalized ellipsometry determination of non-reciprocity in chiral silicon sculptured thin films

(2008) D. Schmidt et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE