4.6 Article

Pixelated source mask optimization for process robustness in optical lithography

Journal

OPTICS EXPRESS
Volume 19, Issue 20, Pages 19384-19398

Publisher

OPTICAL SOC AMER
DOI: 10.1364/OE.19.019384

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Funding

  1. University Research Committee of the University of Hong Kong [10400898]
  2. Research Grants Council of the Hong Kong Special Administrative Region, China [HKU 7134/08E]
  3. UGC

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Optical lithography has enabled the printing of progressively smaller circuit patterns over the years. However, as the feature size shrinks, the lithographic process variation becomes more pronounced. Source-mask optimization (SMO) is a current technology allowing a co-design of the source and the mask for higher resolution imaging. In this paper, we develop a pixelated SMO using inverse imaging, and incorporate the statistical variations explicitly in an optimization framework. Simulation results demonstrate its efficacy in process robustness enhancement. (C) 2011 Optical Society of America

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