Quantitative evaluation of boron-induced disorder in multilayers containing silicon nanocrystals in an oxide matrix designed for photovoltaic applications

Title
Quantitative evaluation of boron-induced disorder in multilayers containing silicon nanocrystals in an oxide matrix designed for photovoltaic applications
Authors
Keywords
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Journal
OPTICS EXPRESS
Volume 18, Issue 21, Pages 22004
Publisher
The Optical Society
Online
2010-10-02
DOI
10.1364/oe.18.022004

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