Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy

Published 2009 View Full Article

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Title
Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy
Authors
Keywords
-
Journal
OPTICS EXPRESS
Volume 17, Issue 16, Pages 13541
Publisher
The Optical Society
Online
2009-07-24
DOI
10.1364/oe.17.013541

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