Investigation of the influence of the aberration induced by a plane interface on STED microscopy

Published 2009 View Full Article

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Title
Investigation of the influence of the aberration induced by a plane interface on STED microscopy
Authors
Keywords
-
Journal
OPTICS EXPRESS
Volume 17, Issue 3, Pages 1714
Publisher
The Optical Society
Online
2009-01-30
DOI
10.1364/oe.17.001714

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