Journal
OPTICAL MATERIALS
Volume 33, Issue 7, Pages 1015-1018Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.optmat.2010.09.022
Keywords
Rare-earth dopant; Transmission electron microscopy; Energy-dispersive X-ray analysis; Electron energy-loss spectroscopy; Electron channeling
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Funding
- Grants-in-Aid for Scientific Research [19053004, 21360321] Funding Source: KAKEN
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Energy-dispersive X-ray analysis based on electron channeling effects in transmission electron microscopy (TEM) was performed on Ca2SnO4 phosphor materials doped with Eu3+/Y3+ at various concentrations, which showed red photoluminescence associated with the Eu3+ D-5(0)-F-7(2) electric dipole transition. The method provided direct information on which host element site impurity elements occupy. The local atomic configurations and chemical bonding states associated with dopant impurities with different ionic radii were also examined by TEM-electron energy-loss spectroscopy (TEM-EELS). (C) 2010 Elsevier B.V. All rights reserved.
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