Automated defect detection in textured materials using wavelet-domain hidden Markov models

Published 2014 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Automated defect detection in textured materials using wavelet-domain hidden Markov models
Authors
Keywords
-
Journal
OPTICAL ENGINEERING
Volume 53, Issue 9, Pages 093107
Publisher
SPIE-Intl Soc Optical Eng
Online
2014-09-26
DOI
10.1117/1.oe.53.9.093107

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.