Journal
OPTICAL AND QUANTUM ELECTRONICS
Volume 42, Issue 2, Pages 89-95Publisher
SPRINGER
DOI: 10.1007/s11082-011-9437-z
Keywords
Gallium nitride; Light-emitting diode; Electron leakage; Efficiency droop; Electron blocker layer
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Nitride-based light-emitting diodes suffer from a reduction (droop) of the internal quantum efficiency (IQE) with increasing injection current. Using advanced device simulation, we investigate the impact of electron leakage on the IQE droop for different properties of the electron blocker layer (EBL). The simulations show a strong influence of the EBL acceptor density on the droop. We also find that the electron leakage decreases with increasing temperature, which contradicts common assumptions.
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