Investigation of the atomic, crystal, and domain structures of materials based on X-ray diffraction and absorption data: A review

Published 2015 View Full Article

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Title
Investigation of the atomic, crystal, and domain structures of materials based on X-ray diffraction and absorption data: A review
Authors
Keywords
SAXS Data, SAXS Measurement, Total External Reflection, SAXS Curve, SAXS Intensity
Journal
TECHNICAL PHYSICS
Volume 60, Issue 11, Pages 1575-1600
Publisher
Pleiades Publishing Ltd
Online
2015-11-14
DOI
10.1134/s1063784215110067
References
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