Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume 332, Issue -, Pages 95-98Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nimb.2014.02.037
Keywords
HPGe; Detector efficiency; Calibration; Quantitative PIXE
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Particle Induced X-ray Emission (PIXE) is an analytical technique, which provides reliably and accurately quantitative results without the need of standards when the efficiency of the X-ray detection system is calibrated. The ion beam microprobe of the Ion Beam Modification and Analysis Laboratory at the University of North Texas is equipped with a 100 mm(2) high purity germanium X-ray detector (Canberra GUL0110 Ultra-LEGe). In order to calibrate the efficiency of the detector for standard less PIXE analysis we have measured the X-ray yield of a set of commercially available X-ray fluorescence standards. The set contained elements from low atomic number Z = 11 (sodium) to higher atomic numbers to cover the X-ray energy region from 1.25 key to about 20 key where the detector is most efficient. The effective charge was obtained from the proton backscattering yield of a calibrated particle detector. (C) 2014 Elsevier B.V. All rights reserved.
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