Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume 268, Issue 11-12, Pages 1929-1932Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nimb.2010.02.104
Keywords
Secondary in mass spectrometry; Fingerprints; Forensic Science; Ion Beam Analysis
Categories
Funding
- Engineering and Physical Sciences Research Council [EP/D032210/1] Funding Source: researchfish
- EPSRC [EP/D032210/1] Funding Source: UKRI
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Police institutions currently have no analytical method of knowing whether a fingerprint was deposited before Or after the document was written or printed. The suitability of using MeV secondary ion mass spectrometry (i.e. SIMS with an MeV ion beam) to determine the order in which a fingerprint and written text were deposited on paper was therefore investigated. A 10 MeV O(4+) beam was used to generate secondary ions from the surface of the samples and to map the molecular fragments from doped fingerprints and inks on paper. The images obtained and the sputtering behaviour of the samples was found to be indicative of the sequence of ink and fingerprint deposits. (C) 2010 Elsevier B.V. All rights reserved.
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