Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
Volume 266, Issue 10, Pages 2401-2404Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nimb.2008.03.056
Keywords
PIXE; XRF; aerosol; MDL
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PIXE and XRF are very effective techniques in atmospheric aerosol investigation, therefore they are extensively used by the authors. In this work an inter-laboratory comparison of the results obtained analysing several samples (collected on different substrata) with both techniques is presented: the samples were analysed by PIXE (in Florence, at the 3 MV Tandetron accelerator of LABEC laboratory) and by XRF (in Genoa and Milan, where two Oxford XRF instruments are operational). The results of the three sets of measurements are in good agreement for all the analysed samples. The aim of this work was also to compare PIXE and XRF performance in atmospheric aerosol analysis with the routine set-up currently in use at the three laboratories, to determine the best technique to be applied depending on the substratum used for aerosol sampling and the main elements of interest for each specific research project. Results of the comparison between the minimum detection limits of both techniques will be shown for all the measured elements, for different substrata (Teflon, polycarbonate and cellulose mixed esters). (C) 2008 Elsevier B.V. All rights reserved.
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