Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Volume 652, Issue 1, Pages 149-152Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nima.2011.01.159
Keywords
CdTe; Schottky diode; X-ray; Gamma-ray; Polarization; Deep acceptor
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Funding
- Grants-in-Aid for Scientific Research [21684015] Funding Source: KAKEN
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Schottky CdTe diode detectors suffer from a polarization phenomenon, which is characterized by degradation of the spectral properties over time following exposure to high bias voltage. This is considered attributable to charge accumulation at deep acceptor levels. A Schottky CdTe diode was illuminated with an infrared light for a certain period during a bias operation, and two opposite behaviors emerged. The detector showed a recovery when illuminated after the bias-induced polarization had completely progressed. Conversely, when the detector was illuminated before the emergence of bias-induced polarization, the degradation of the spectral properties was accelerated. Interpretation of these effects and discussion on the energy level of deep acceptors are presented. (C) 201 1 Elsevier B.V. All rights reserved.
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