Journal
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
Volume 591, Issue 1, Pages 209-212Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.nima.2008.03.058
Keywords
X- and gamma-ray solid-state detectors; growth from melts; zone melting and refining
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The combination of Bridgman, recrystallization by dissolving in pure water under hydrothermal conditions and travelling molten zone (TMZ) methods were used for TlBr purification. Detectors of 0.5 and 3 turn thickness were produced from a single crystal grown by the TMZ method. The samples had stable spectrometric characteristics from -40 degrees C to room temperature. A resolution of 3.7% at 60 keV (Am-241 source) was attained for 3-mm sample at 0 degrees C. Electrical and spectroscopic properties of the detectors are reported and discussed. (C) 2008 Elsevier B.V. All rights reserved.
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