Journal
SURFACE AND INTERFACE ANALYSIS
Volume 47, Issue 11, Pages 1051-1055Publisher
WILEY
DOI: 10.1002/sia.5812
Keywords
Au-400 SIMS; cluster SIMS; event-by-event bombardment; detection; diblock brush terpolymers; self-assembly; nanodomain
Categories
Funding
- National Science Foundation [CHE-1308312, DMR-1105304]
- Dow Chemical Company
- Welch Foundation [A-0001]
- Direct For Mathematical & Physical Scien
- Division Of Chemistry [1308312] Funding Source: National Science Foundation
- Division Of Materials Research
- Direct For Mathematical & Physical Scien [1105304] Funding Source: National Science Foundation
Ask authors/readers for more resources
We present the application of cluster-SIMS for the analysis of the nanoscopic surface of diblock brush terpolymers (DBTs). This novel SIMS technique differs from conventional SIMS. It uses Au-400(4+) projectiles at 520keV and an event-by-event bombardment/detection regime for the analysis of co-localized molecular species. The performance of this SIMS method was tested on bottle brush' block molecules featuring a vertical aligned backbone structure. We were able to assess the extent of secondary ion emissions from the surface and analyze the degree of ordered alignment for DBTs by the fluorocarbon surface coverage. We demonstrate the feasibility of characterizing the homogeneity of macromolecular films at the nanoscale. Copyright (c) 2015 John Wiley & Sons, Ltd.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available
Share Paper
