A platform forin-situmulti-probe electronic measurements and modification of nanodevices inside a transmission electron microscope
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Title
A platform forin-situmulti-probe electronic measurements and modification of nanodevices inside a transmission electron microscope
Authors
Keywords
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Journal
NANOTECHNOLOGY
Volume 25, Issue 22, Pages 225702
Publisher
IOP Publishing
Online
2014-05-16
DOI
10.1088/0957-4484/25/22/225702
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