Improved atomic force microscope infrared spectroscopy for rapid nanometer-scale chemical identification

Published 2013 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Improved atomic force microscope infrared spectroscopy for rapid nanometer-scale chemical identification
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 24, Issue 44, Pages 444007
Publisher
IOP Publishing
Online
2013-10-12
DOI
10.1088/0957-4484/24/44/444007

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.