Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects

Published 2012 View Full Article

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Title
Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 23, Issue 30, Pages 305707
Publisher
IOP Publishing
Online
2012-07-11
DOI
10.1088/0957-4484/23/30/305707

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