Nanometer-scale, quantitative composition mappings of InGaN layers from a combination of scanning transmission electron microscopy and energy dispersive x-ray spectroscopy

Published 2012 View Full Article

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Journal

NANOTECHNOLOGY

Volume 23, Issue 45, Pages 455707

Publisher

IOP Publishing

Online

2012-10-23

DOI

10.1088/0957-4484/23/45/455707

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