Indirect identification and compensation of lateral scanner resonances in atomic force microscopes

Published 2011 View Full Article

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Title
Indirect identification and compensation of lateral scanner resonances in atomic force microscopes
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 22, Issue 31, Pages 315701
Publisher
IOP Publishing
Online
2011-07-06
DOI
10.1088/0957-4484/22/31/315701

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