Development of a pattern to measure multiscale deformation and strain distribution viain situFE-SEM observations

Published 2011 View Full Article

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Title
Development of a pattern to measure multiscale deformation and strain distribution viain situFE-SEM observations
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 22, Issue 11, Pages 115704
Publisher
IOP Publishing
Online
2011-02-09
DOI
10.1088/0957-4484/22/11/115704

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