An improved AFM cross-sectional method for piezoelectric nanostructures properties investigation: application to GaN nanowires

Published 2011 View Full Article

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Title
An improved AFM cross-sectional method for piezoelectric nanostructures properties investigation: application to GaN nanowires
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 22, Issue 10, Pages 105704
Publisher
IOP Publishing
Online
2011-02-03
DOI
10.1088/0957-4484/22/10/105704

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