A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials

Published 2011 View Full Article

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Title
A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 22, Issue 28, Pages 285205
Publisher
IOP Publishing
Online
2011-06-10
DOI
10.1088/0957-4484/22/28/285205

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