Giant piezoresistance of p-type nano-thick silicon induced by interface electron trapping instead of 2D quantum confinement

Title
Giant piezoresistance of p-type nano-thick silicon induced by interface electron trapping instead of 2D quantum confinement
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 22, Issue 1, Pages 015501
Publisher
IOP Publishing
Online
2010-12-07
DOI
10.1088/0957-4484/22/1/015501

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