Kelvin probe force microscopy for conducting nanobits of NiO thin films

Published 2010 View Full Article

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Title
Kelvin probe force microscopy for conducting nanobits of NiO thin films
Authors
Keywords
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Journal
NANOTECHNOLOGY
Volume 21, Issue 21, Pages 215704
Publisher
IOP Publishing
Online
2010-05-01
DOI
10.1088/0957-4484/21/21/215704
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