Material and doping transitions in single GaAs-based nanowires probed by Kelvin probe force microscopy

Published 2009 View Full Article

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Title
Material and doping transitions in single GaAs-based nanowires probed by Kelvin probe force microscopy
Authors
Keywords
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Journal
NANOTECHNOLOGY
Volume 20, Issue 38, Pages 385702
Publisher
IOP Publishing
Online
2009-08-29
DOI
10.1088/0957-4484/20/38/385702

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