Simulation of atomic force microscopy operation via three-dimensional finite element modelling

Published 2009 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Simulation of atomic force microscopy operation via three-dimensional finite element modelling
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 20, Issue 6, Pages 065702
Publisher
IOP Publishing
Online
2009-01-16
DOI
10.1088/0957-4484/20/6/065702

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.