Bias spectroscopy and simultaneous single-electron transistor charge state detection of Si:P double dots

Published 2008 View Full Article

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Title
Bias spectroscopy and simultaneous single-electron transistor charge state detection of Si:P double dots
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 19, Issue 26, Pages 265201
Publisher
IOP Publishing
Online
2008-05-20
DOI
10.1088/0957-4484/19/26/265201

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