Filament growth dynamics in solid electrolyte-based resistive memories revealed by in situ TEM
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Title
Filament growth dynamics in solid electrolyte-based resistive memories revealed by in situ TEM
Authors
Keywords
resistive switching, conductive filaments, <em class=EmphasisTypeItalic >in situ</em> transmission electron microscope, real-time observation, computer simulation
Journal
Nano Research
Volume 7, Issue 7, Pages 1065-1072
Publisher
Springer Nature
Online
2014-06-26
DOI
10.1007/s12274-014-0469-0
References
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