In situ Raman spectroscopy of topological insulator Bi2Te3 films with varying thickness

Title
In situ Raman spectroscopy of topological insulator Bi2Te3 films with varying thickness
Authors
Keywords
topological insulator, <em class=EmphasisTypeItalic >in situ</em> Raman spectroscopy, surface phonon mode, thin film
Journal
Nano Research
Volume 6, Issue 9, Pages 688-692
Publisher
Springer Nature
Online
2013-07-11
DOI
10.1007/s12274-013-0344-4

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