Robust reduction of graphene fluoride using an electrostatically biased scanning probe
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Title
Robust reduction of graphene fluoride using an electrostatically biased scanning probe
Authors
Keywords
graphene fluoride, graphene, electrostatic lithography, Kelvin force probe microscopy, atomic force microscopy-based electrostatic nanolithography (AFMEN)
Journal
Nano Research
Volume 6, Issue 11, Pages 767-774
Publisher
Springer Nature
Online
2013-08-14
DOI
10.1007/s12274-013-0355-1
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