Robust reduction of graphene fluoride using an electrostatically biased scanning probe

Title
Robust reduction of graphene fluoride using an electrostatically biased scanning probe
Authors
Keywords
graphene fluoride, graphene, electrostatic lithography, Kelvin force probe microscopy, atomic force microscopy-based electrostatic nanolithography (AFMEN)
Journal
Nano Research
Volume 6, Issue 11, Pages 767-774
Publisher
Springer Nature
Online
2013-08-14
DOI
10.1007/s12274-013-0355-1

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