Journal
NANO LETTERS
Volume 14, Issue 11, Pages 6499-6504Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nl5030613
Keywords
X-ray microscopy; chemical imaging; scanning tunneling microscopy; smart tips; synchrotron
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Funding
- Office of Science Early Career Research Program through the Division of Scientific User Facilities, Office of Basic Energy Sciences, U.S. Department of Energy [SC70705]
- U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-AC02-06CH11357, DE-FG02-02ER46012]
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By using synchrotron X-rays as a probe and a nanofabricated smart tip of a tunneling microscope as a detector, we have achieved chemical fingerprinting of individual nickel clusters on a Cu(111) surface at 2 nm lateral resolution, and at the ultimate single-atomic height sensitivity. Moreover, by varying the photon energy, we have succeeded to locally measure photoionization cross sections of just a single Ni nanocluster, which opens new exciting opportunities for chemical imaging of nanoscale materials.
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