Journal
NANO LETTERS
Volume 15, Issue 1, Pages 211-217Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nl503389b
Keywords
AFM; TEM; electronic properties; interface structure; metal oxide; metal-semiconductor interface
Categories
Funding
- Department of Energy, Office of Basic Energy Science [DE-FG02-00ER45813]
- Nano/Bio Interface Center [DMR08-32802]
- Laboratory for Research on the Structure of Matter [DMR11-20901]
- U.S. Department of Energy (DOE) [DE-FG02-00ER45813] Funding Source: U.S. Department of Energy (DOE)