Quantification of Deep Traps in Nanocrystal Solids, Their Electronic Properties, and Their Influence on Device Behavior

Title
Quantification of Deep Traps in Nanocrystal Solids, Their Electronic Properties, and Their Influence on Device Behavior
Authors
Keywords
-
Journal
NANO LETTERS
Volume 13, Issue 11, Pages 5284-5288
Publisher
American Chemical Society (ACS)
Online
2013-10-29
DOI
10.1021/nl402803h

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