Quantitatively Enhanced Reliability and Uniformity of High-κ Dielectrics on Graphene Enabled by Self-Assembled Seeding Layers

Published 2013 View Full Article

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Title
Quantitatively Enhanced Reliability and Uniformity of High-κ Dielectrics on Graphene Enabled by Self-Assembled Seeding Layers
Authors
Keywords
-
Journal
NANO LETTERS
Volume 13, Issue 3, Pages 1162-1167
Publisher
American Chemical Society (ACS)
Online
2013-02-07
DOI
10.1021/nl3045553

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