In Situ TEM Near-Field Optical Probing of Nanoscale Silicon Crystallization

Published 2012 View Full Article

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Title
In Situ TEM Near-Field Optical Probing of Nanoscale Silicon Crystallization
Authors
Keywords
-
Journal
NANO LETTERS
Volume 12, Issue 5, Pages 2524-2529
Publisher
American Chemical Society (ACS)
Online
2012-04-04
DOI
10.1021/nl3007352

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