Journal
NANO LETTERS
Volume 12, Issue 2, Pages 709-713Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nl2036222
Keywords
Quantum dot; Coulomb blockade; single-electron tunneling; atomic force microscopy; excited-state spectroscopy; charge sensing
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Funding
- Natural Sciences and Engineering Research Council of Canada
- le Fonds Quebecois de le Recherche sur la Nature et les Technologies
- Carl Reinhardt Fellowship
- Canadian Institute for Advanced Research
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We present a new charge sensing technique for the excited-state spectroscopy of individual quantum dots, which requires no patterned electrodes. An oscillating atomic force microscope cantilever is used as a movable charge sensor as well as gate to measure the single-electron tunneling between an individual self-assembled InAs quantum dot and back electrode. A set of cantilever dissipation versus bias voltage curves measured at different cantilever oscillation amplitudes forms a diagram analogous to the Coulomb diamond usually measured with transport measurements. The excited-state levels as well as the electron addition spectrum can be obtained from the diagram. In addition, a signature which can result from inelastic tunneling by phonon emission or a peak in the density of states of the electrode is also observed, which demonstrates the versatility of the technique.
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