Direct Measurement of Individual Deep Traps in Single Silicon Nanowires

Published 2011 View Full Article

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Title
Direct Measurement of Individual Deep Traps in Single Silicon Nanowires
Authors
Keywords
-
Journal
NANO LETTERS
Volume 11, Issue 6, Pages 2499-2502
Publisher
American Chemical Society (ACS)
Online
2011-05-17
DOI
10.1021/nl201019b

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