Journal
NANO LETTERS
Volume 8, Issue 2, Pages 749-753Publisher
AMER CHEMICAL SOC
DOI: 10.1021/nl0725300
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Far-field near-infrared fluorescence microscopy of single-walled carbon nanotubes (SWNTs) has been hampered by the diffraction limit to resolution. A new analysis method is presented that allows subwavelength (lambda/10) mapping of single-molecule chemical reaction sites on semiconducting SWNTs, enabling precise localization of excitonic luminescence regions along the nanotube axis through a nonperturbing, far-field optical measurement. This method is applied to reveal the subdiffraction lengths, curvatures, and defects of luminescent SWNTs in unprecedented detail.
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