Imaging Dielectric Properties of Si Nanowire Oxide with Conductive Atomic Force Microscopy Complemented with Femtosecond Laser Illumination

Published 2008 View Full Article

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Title
Imaging Dielectric Properties of Si Nanowire Oxide with Conductive Atomic Force Microscopy Complemented with Femtosecond Laser Illumination
Authors
Keywords
-
Journal
NANO LETTERS
Volume 8, Issue 7, Pages 1949-1953
Publisher
American Chemical Society (ACS)
Online
2008-05-29
DOI
10.1021/nl0807171

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