A New Silicon Drift Detector for High Spatial Resolution STEM-XEDS: Performance and Applications

Title
A New Silicon Drift Detector for High Spatial Resolution STEM-XEDS: Performance and Applications
Authors
Keywords
-
Journal
MICROSCOPY AND MICROANALYSIS
Volume 20, Issue 04, Pages 1046-1052
Publisher
Cambridge University Press (CUP)
Online
2014-07-29
DOI
10.1017/s1431927614001639

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