4.5 Review

Aberration-Corrected X-Ray Spectrum Imaging and Fresnel Contrast to Differentiate Nanoclusters and Cavities in Helium-Irradiated Alloy 14YWT

Journal

MICROSCOPY AND MICROANALYSIS
Volume 20, Issue 2, Pages 613-626

Publisher

CAMBRIDGE UNIV PRESS
DOI: 10.1017/S1431927614000312

Keywords

EDS; Fresnel contrast; aberration correction; multivariate statistical analysis; nanostructured ferritic alloy

Funding

  1. Materials Sciences and Engineering Division, Office of Basic Energy Sciences, US Department of Energy
  2. ORNL's Center for Nanophase Materials Sciences (CNMS)
  3. Scientific User Facilities Division, Office of Basic Energy Sciences, US Department of Energy
  4. State of North Carolina
  5. National Science Foundation

Ask authors/readers for more resources

Helium accumulation negatively impacts structural materials used in neutron-irradiated environments, such as fission and fusion reactors. Next-generation fission and fusion reactors will require structural materials, such as steels, that are resistant to large neutron doses yet see service temperatures in the range most affected by helium embrittlement. Previous work has indicated the difficulty of experimentally differentiating nanometer-sized cavities such as helium bubbles from the Ti-Y-O rich nanoclusters (NCs) in radiation-tolerant nanostructured ferritic alloys (NFAs). Because the NCs are expected to sequester helium away from grain boundaries and reduce embrittlement, experimental methods to study simultaneously the NC and bubble populations are needed. In this study, aberration-corrected scanning transmission electron microscopy (STEM) results combining high-collection-efficiency X-ray spectrum images (SIs), multivariate statistical analysis (MVSA), and Fresnel-contrast bright-field STEM imaging, have been used for such a purpose. Fresnel-contrast imaging, with careful attention to TEM-STEM reciprocity, differentiates bubbles from NCs. MVSA of X-ray SIs unambiguously identifies NCs. Therefore, combined Fresnel-contrast STEM and X-ray SI is an effective STEM-based method to characterize helium-bearing NFAs.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.5
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available